Tag Archives: Test & Measurement

#Productronica Modular breakout system.

Posted on November 5, 2015 by Eoin Ó Riain

Pickering Interfaces and OPAL-RT TECHNOLOGIES, a leading developer of real-time digital simulators and Hardware-In-the-Loop testing equipment announce their partnership for Pickering’s new Modular Breakout System at Hall A1.452. Pickering Interfaces, in partnership with OPAL-RT TECHNOLOGIES, designed a low-cost Modular Breakout System … Continue reading →

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#Productronica Device programming in the manufacturing process.

Posted on October 29, 2015 by Eoin Ó Riain

Adaptsys is launching ProgWorx ISP, a programming system for the parallel programming of panels containing multiple boards as an aid to optimising the manufacturing process. The unit is being shown for the first time at Productronica on Booth 421 in Hall … Continue reading →

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#Productronica The ultimate flying probe test technology.

Posted on October 12, 2015 by Eoin Ó Riain

On the threshold of 30 years of business, Seica Spa continues to lead the way on the road to innovation, showing a complete range of innovative solutions for every board test requirement, from printed circuits to the most complex assembled … Continue reading →

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#NIWeek Control systems optimised for the Industrial IoT.

Posted on August 6, 2015 by Eoin Ó Riain

National Instruments (NI) has announced the new embedded systems hardware based on the open, flexible LabVIEW reconfigurable I/O (RIO) architecture. This hardware includes the high-performance CompactRIO Controller for integrators with rugged, industrial applications, Controller for FlexRIO for designers with high-performance … Continue reading →

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#NIWeek Write Code Faster with LabVIEW 2015!

Posted on August 4, 2015 by Eoin Ó Riain

LabVIEW 2015 system design software has been announced at this years NIWeek being held in Austin (TX USA). The latest version delivers speed improvements, development shortcuts, and debugging tools. It continues to standardise the way LabVIEW users interact with almost any hardware … Continue reading →

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@SensorsShow Debut for emissions & pressure sensors and signal amplifiers.

Posted on July 1, 2015 by Eoin Ó Riain

Kistler Instruments are showing three new products at the Sensors & Instrumentation Show 2015 in Birmingham (GB); acoustic emission sensors, high sensitivity miniature pressure sensors and a signal amplifier for both piezoelectric and voltage output sensors. AE Sensors The Kistler … Continue reading →

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#NIweek CompactRIO software-designed controller simplifies control systems!

Posted on August 8, 2014 by Eoin Ó Riain

National Instruments has announced the CompactRIO performance controller. This software-designed controller integrates the latest embedded technologies from Intel and Xilinx to deliver unparalleled performance and flexibility, and is fully supported by LabVIEW 2014 and NI Linux Real-Time. It is ideal for … Continue reading →

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#NIWeek Rugged CompactDAQ controller reduces system costs!

Posted on August 7, 2014 by Eoin Ó Riain

The CompactDAQ 4-slot controller integrates an Intel Atom processor and high-accuracy measurements into a small, affordable form factor. The CompactDAQ 4-slot controller has been announced by National Instruments. By integrating the processor, signal conditioning and I/O into a single CompactDAQ system, … Continue reading →

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#NIWeek New wave of software-designed instruments

Posted on August 6, 2014 by Eoin Ó Riain

Paradigm shift redefines capability of oscilloscopes, RF signal analyzers and high-speed serial instruments National Instruments has announced that it has delivered the power and flexibility of software-designed instrumentation to new instrument types and automated test applications, further freeing engineers and organisations … Continue reading →

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#NIweek Software adds new capabilities to acquire, analyse and visualise data from anywhere, at any time

Posted on August 4, 2014 by Eoin Ó Riain

Make informed decisions fast with LabVIEW 2014 National Instruments has announced LabVIEW 2014 system design software, the heart of the NI platform, featuring upgrades to help users acquire, analyse and visualise data sets to make informed decisions fast. LabVIEW 2014 standardises … Continue reading →

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