Tag Archives: Test+Measurement

#NIWeek Semiconductor ATE cost reduced with PXI-Based Test Systems.

Posted on August 7, 2014 by Eoin Ó Riain

The NI Semiconductor Test System (STS) series has been announced by National Instruments at NIweek in Austin (TX USA). These PXI-based automated test systems reduce test cost for RF and mixed-signal devices by opening access to NI- and industry-offered PXI … Continue reading →

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Pickering Interfaces’ switching modules and chassis @productronica

Posted on October 25, 2013 by Eoin Ó Riain

Pickering Interfaces is to showcase it’s newest switching modules and chassis at productronica 2013. These products include PXI RF Solid State 6 GHz Multiplexers, 3U 16Amp PXI Switching Modules, 5Amp PXI Power Multiplexer Module, 32-Channel PCI Digital I/O Card, an … Continue reading →

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#HM13 Versatile device management wizard

Posted on April 8, 2013 by Eoin Ó Riain

Yokogawa Electric Corporation is to release the FieldMate(TM) R2.06 Versatile Device Management Wizard in mid-May. FieldMate is a versatile software program for configuring, adjusting, and managing a wide variety of field devices used in factories and other production sites. This latest … Continue reading →

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