Search Results for: #NIweek

#NIWeek Helping engineers solve big data challenges.

New CompactDAQ measurement systems with Intel Atom quad-core and USB 3.0 technology, DIAdem 2015 and DataFinder Server Edition 2015 create smarter measurement and data management solutions. New hardware and software additions have been announced by National Instruments to help engineers … Continue reading

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#NIWeek Wireless production test.

The Wireless Test System (WTS), is a solution from National Instruments (NI), that dramatically lowers the cost of high-volume wireless manufacturing test. Although faced with the rising complexity of wireless test, companies can confidently reduce test costs and multiply throughput … Continue reading

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#NIWeek Control systems optimised for the Industrial IoT.

National Instruments (NI) has announced the new embedded systems hardware based on the open, flexible LabVIEW reconfigurable I/O (RIO) architecture. This hardware includes the high-performance CompactRIO Controller for integrators with rugged, industrial applications, Controller for FlexRIO for designers with high-performance … Continue reading

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#NIWeek Write Code Faster with LabVIEW 2015!

LabVIEW 2015 system design software has been announced at this years NIWeek being held in Austin (TX USA). The latest version delivers speed improvements, development shortcuts, and debugging tools. It continues to standardise the way LabVIEW users interact with almost any hardware … Continue reading

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#NIweek CompactRIO software-designed controller simplifies control systems!

National Instruments has announced the CompactRIO performance controller. This software-designed controller integrates the latest embedded technologies from Intel and Xilinx to deliver unparalleled performance and flexibility, and is fully supported by LabVIEW 2014 and NI Linux Real-Time. It is ideal for … Continue reading

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#NIWeek Semiconductor ATE cost reduced with PXI-Based Test Systems.

The NI Semiconductor Test System (STS) series has been announced by National Instruments at NIweek in Austin (TX USA). These PXI-based automated test systems reduce test cost for RF and mixed-signal devices by opening access to NI- and industry-offered PXI … Continue reading

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#NIWeek Rugged CompactDAQ controller reduces system costs!

The CompactDAQ 4-slot controller integrates an Intel Atom processor and high-accuracy measurements into a small, affordable form factor. The CompactDAQ 4-slot controller has been announced by National Instruments. By integrating the processor, signal conditioning and I/O into a single CompactDAQ system, … Continue reading

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#NIWeek New wave of software-designed instruments

Paradigm shift redefines capability of oscilloscopes, RF signal analyzers and high-speed serial instruments National Instruments has announced that it has delivered the power and flexibility of software-designed instrumentation to new instrument types and automated test applications, further freeing engineers and organisations … Continue reading

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#NIweek Software adds new capabilities to acquire, analyse and visualise data from anywhere, at any time

Make informed decisions fast with LabVIEW 2014 National Instruments has announced LabVIEW 2014 system design software, the heart of the NI platform, featuring upgrades to help users acquire, analyse and visualise data sets to make informed decisions fast. LabVIEW 2014 standardises … Continue reading

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#NIweek Reach of software-designed instrumentation for electronic test extended

Instrument driver FPGA extensions, Xilinx 7 Series FPGAs and the industry’s first PXImc adapter module expand the LabVIEW RIO architecture to reduce the total cost of test. National Instruments also announced several additions to its NI LabVIEW reconfigurable I/O (RIO) … Continue reading

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