Tag Archives: NI Week

#NIweek CompactRIO software-designed controller simplifies control systems!

Posted on August 8, 2014 by Eoin Ó Riain

National Instruments has announced the CompactRIO performance controller. This software-designed controller integrates the latest embedded technologies from Intel and Xilinx to deliver unparalleled performance and flexibility, and is fully supported by LabVIEW 2014 and NI Linux Real-Time. It is ideal for … Continue reading →

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#NIWeek Semiconductor ATE cost reduced with PXI-Based Test Systems.

Posted on August 7, 2014 by Eoin Ó Riain

The NI Semiconductor Test System (STS) series has been announced by National Instruments at NIweek in Austin (TX USA). These PXI-based automated test systems reduce test cost for RF and mixed-signal devices by opening access to NI- and industry-offered PXI … Continue reading →

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#NIWeek Rugged CompactDAQ controller reduces system costs!

Posted on August 7, 2014 by Eoin Ó Riain

The CompactDAQ 4-slot controller integrates an Intel Atom processor and high-accuracy measurements into a small, affordable form factor. The CompactDAQ 4-slot controller has been announced by National Instruments. By integrating the processor, signal conditioning and I/O into a single CompactDAQ system, … Continue reading →

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#NIWeek New wave of software-designed instruments

Posted on August 6, 2014 by Eoin Ó Riain

Paradigm shift redefines capability of oscilloscopes, RF signal analyzers and high-speed serial instruments National Instruments has announced that it has delivered the power and flexibility of software-designed instrumentation to new instrument types and automated test applications, further freeing engineers and organisations … Continue reading →

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#NIweek Software adds new capabilities to acquire, analyse and visualise data from anywhere, at any time

Posted on August 4, 2014 by Eoin Ó Riain

Make informed decisions fast with LabVIEW 2014 National Instruments has announced LabVIEW 2014 system design software, the heart of the NI platform, featuring upgrades to help users acquire, analyse and visualise data sets to make informed decisions fast. LabVIEW 2014 standardises … Continue reading →

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#NIweek Reach of software-designed instrumentation for electronic test extended

Posted on August 12, 2013 by Eoin Ó Riain

Instrument driver FPGA extensions, Xilinx 7 Series FPGAs and the industry’s first PXImc adapter module expand the LabVIEW RIO architecture to reduce the total cost of test. National Instruments also announced several additions to its NI LabVIEW reconfigurable I/O (RIO) … Continue reading →

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#NIweek Students can design sophisticated systems in one semester

Posted on August 9, 2013 by Eoin Ó Riain

National Instruments has expanded its commitment to engineering education with the release of NI myRIO, its latest educational product offering. Based on the same powerful technology as the popular NI CompactRIO platform, NI myRIO is smaller and more student-friendly than … Continue reading →

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#NIweek Ditch the Lab: Take measurements in rugged environments

Posted on August 8, 2013 by Eoin Ó Riain

NI extends its investment in the NI CompactDAQ platform with a new rugged chassis, as well as NI CompactDAQ support for the LabVIEW Electrical Power Suite. The NI cDAQ-9188XT, an 8-slot NI CompactDAQ Ethernet chassis designed for distributed or remote measurements … Continue reading →

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#NIweek National Instruments redesigns NI CompactRIO from the inside out

Posted on August 8, 2013 by Eoin Ó Riain

The new NI cRIO-9068 software-designed controller is part of the most advanced and open system design platform for embedded control and monitoring systems National Instruments announced the new cRIO-9068 software-designed controller, which is completely redesigned but maintains full NI LabVIEW … Continue reading →

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#NIweek LabVIEW 2013 helps users focus on innovation Instead of infrastructure

Posted on August 6, 2013 by Eoin Ó Riain

National Instruments has introduced NI LabVIEW 2013 the latest version of its industry-leading design platform. The launch took place at NI Week in Austin (TX USA 5-8 August 2013). Users can take advantage of the most advanced technologies without rewriting their … Continue reading →

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