Tag Archives: RF

#NIweek RF redefined

“A quarter-century ago, NI redefined instrumentation with LabVIEW system design software, and now we are doing it again with our vector signal transceiver,” said Dr. James Truchard, President, CEO and Cofounder of National Instruments. “When we first started our company, … Continue reading

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#NIWeek: PXI RF test performance extended

New vector signal analyser delivers industry’s best performance and surpasses box instrumentation We attended a press event organised by National Instruments and held in the Royal Society’s historic headquarters in London. It was entitled Tools should not limit discovery and … Continue reading

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