Geotest Expands Semiconductor Test Capabilities with New TS-900 Model and Digital Test Software at Electronica 2012, Hall A1, booth 621 (Schneider and Koch Booth)
Geotest has expanded the capabilities of the TS-900 semiconductor test system with the addition of a new manipulator option and automated handler compatible receiver. The Reid-Ashman OM1069 manipulator is designed specifically for the TS-900 and allows precise positioning and flexibility for interfacing to automated probers and device handlers used for production testing of semiconductor devices. The manipulator’s spring loaded design allows for easy alignment and docking to handlers – eliminating the need for a complex receiver interface.
New Receiver Configuration Adapts to Automated Handler Applications
The TS-900-OM also features a new handler compatible receiver, which offers the flexibility to interface to virtually any device handler. In addition, fixture compatibility is maintained with the TS-900’s current receiver, allowing users to interchange load boards between the screw down and slide receiver configurations.
New Digital Test Capabilities
Geotest has also introduced new digital test tools and capabilities for component test applications. Expanding the capabilities of its market leading GX5295 digital test instrument, Geotest’s DIOEasy-FIT software now provides users with the ability to import and convert WGL, STIL, and VCD/EVCD file formats to Geotest’s DIO file format, providing test engineers a quick and easy way to import test vectors from simulation and design environments. The GX5295’s test capabilities have also been expanded with the addition of go/no-go PMU test capability, which provides high speed, parallel DC testing of devices.
Support for file importing and conversion is part of the DIOEasy-FIT option and the expanded test capabilities for the GX5295 are included with the GTDIO instrument driver package.